Elemental analysis

Methods for elemental analysis

A number of highly sensitive methods for elementary analysis offers an optimal fitted approach for all questions. In addition to emissions and mass spectroscopy by inductive coupled plasma (ICP-OES and ICP-MS) the project group IWKS devices for the precise determination of light elements (ONH- and CH-CS analysis) and offers several variations for X-ray fluorescence analysis (XRF). To claim the highest spectral resolution the wavelength dispersive XRF offers. The 2D spatial-resolved analysis of the element distribution on larger components (up to 200 x 150 mm²) can be realized by micro-XRF and for a high resolution 2D or 3D determination are implemented energy dispersive and wavelength dispersive X-ray-detectors on electron and ion focused ion-beam microscope.

Micro-X-ray fluorescence analysis

ICP-Emissions-Spectrometry (ICP-OES)

ICP-Mass-Spectrometry (ICP-MS)

ONH-Analysis

CH-Analysis

CS-Analysis

 

 

 

 

 

 

currently under construction

Hg-Analysis