Microscopy and nanoanalysis

© Fraunhofer IWKS

Micro- and nanostructural properties determine the functionality of products and material systems. We support you in the development and optimization of manufacturing processes as well as in the investigation of error sources.


  • Mechanical pre-preparation
  • Microstructural cross-section preparation TIC, FIB


  • Light microscopy
  • Scanning electron microscopy REM
  • Focused Ion Beam (FIB) Tomography


  • 3D Atomic probe 3DAP