X-Ray Diffraction

X-Ray Diffraction (XRD)

Sample characteristics:   

  • Crystalline organic or inorganic materials as well as composites, mixtures
  • Shape: powders, solid samples, thin samples/films
  • Required amount depending on scattered intensity and preparation: 10 milligrams – 1 gram

 

 

Available applications:  

  • Phase identification
  • Phase quantification
  • Structure determination and refinement
  • Crystallinity determination
  • Determination of amorphous content
  • Characterisation of air sensitive samples

 

Technical equipment:      

Empyrean (PANalytical)

  • Used wavelength: Co-Kα1; λ = 0,176 nm
  • Operating mode: reflection or transmission
  • Beam optics for divergent and parallel x-ray beam as well as point focus for micro-diffraction
  • Sample changer: 45 samples
  • x, y, z-stage for solid irregular shaped samples (max. 95 x 95 x 500 mm³, max. 2 kg)    
  • Anton Paar HTK 2000N
  • Anton Paar XRK 900