Technology components

To determine the structure, properties and composition


Diffraction methods


  • X-Ray Diffraction (XRD)
  • Particle analytics

Separation and identification of mixtures of substances



  • Gas chromatography (GC-MS)
  • High performance liquid chromatography (HPLC)
  • Ion exchange chromatography (HPIC)

Determination of elements contained in organic and inorganic compounds

Elemental analysis


  • Micro-X-ray fluorescence analysis
  • ICP-Emissions-Spectrometry (ICP-OES)
  • ICP-Mass-Spectrometry (ICP-MS)
  • ONH-Analysis
  • CH-Analysis
  • CS-Analysis
  • Hg-Analysis

Magnetic measurements


  • Permagraph / Remagraph
  • Kerr-Microscopy
  • Physical property measurement system (PPMS)

Properties of materials


  • Density determination
  • Flashpoint measurement
  • Water content determination
  • Particle analysis
  • Refractometer
  • Rheometry

Mapping and analysis of object surfaces and layers



  • Scanning electron microscopy (SEM)
  • Focused Ion Beam microscopy (FIB)
  • 3D atom probe microscopy (3D-APT)

Characterization of molecular properties and identification of atomic components

Molecular spectroscopy


  • Infrared-Spectroscopy (FT-IR)
  • Fluorescence Spectroscopy
  • Raman Spectroscopy
  • UV-VIS-Spectroscopy

Thermal analysis


  • Differential thermal analysis under hydrogen (HD-DTA)
  • Dynamic differential scanning calorimetry (DSC-DTA-TG-MS)
  • High-Temperature X-Ray Diffraction (HT-XRD)
  • Thermo-optical measuring device (TOM)